About

SAIF Guwahati

Sophisticated Analytical Instrument Facility (SAIF) Guwahati

( Sponsored by Dept. of Science & Technology, Govt. of India)

Department of Instrumentation & USIC

Gauhati University

Guwahati 781014

Sophisticated Analytical Instrument Facility (SAIF) Guwahati, sponsored by the Department of Science & Technology (DST), Govt. of India was established in 1986 during Seventh Plan as a National X-ray Facility in the Department of Instrumentation & USIC, Gauhati University with the objective of extending modern sophisticated analytical facility to  researchers & scientific  community and to cultivate the instrumentation culture. SAIF Guwahati comprises of sophisticated X-ray instruments, is a open facility and caters to the need of researchers and scientific community from academic, research and industrial organizations.                              

At present, SAIF Guwahati is equipped with the following sophisticated instruments

1.      Phillips X’Pert Pro Powder X-ray Diffractometer  ( XRD ) 

2.      PANalytical AXIOS Sequential X-ray Fluorescence Spectrometer (XRF )

3.      Bruker Smart Apex II X-ray Single Crystal Diffractometer ( SCXRD )

4.      Sample Preparation Accessories : Stereo zoom Microscope with polarizer, Pulveriser, Precision Electronic Balance, Pressed pellet making facility, Fused bead making facility, muffle furnace.

 Samples for XRD : Solid samples in the form of dry Powder of 300 mesh about 3g of sample on glass slide of size 2cm x 3.5 cm and thickness 0.2cm with uniform layer of size 2cm x 1.5cm on one side is required. XRD of less amount of sample or user specific sample is also possible in special cases.

 XRD Applications : The output consists of X-ray Diffractogram, Peak Position, d values and relative intensity data. Phase Identification, Quantitative analysis of minerals, Grazing incidence XRD of thin film, determination of unit cell parameters, particle size measurement.

 Samples for XRF : Sample in the form of dry powder about 200 mesh, about 10g is required for estimation of major & minor element oxides and qualitative analysis. Qualitative analysis may be possible with less amount of sample in some cases. In case of non-powder sample, the sample should be in suitable form. For trace element analysis, 20 g of sample is required.

 XRF Applications :

                        1.      Qualitative analysis

                        2.      Quantitative analysis

 Qualitative analysis : Qualitative elemental analysis are done for detection of elements present in the sample. Detectable elemental range is from oxygen to uranium. Lower limit of detection varies from element to element and depends upon nature and compositional matrix of the sample.

 Quantitative analysis : Quantitative analysis of silicate rocks, cement and limestone are being done. Quantitative analysis of silicate rocks for 10 major & minor oxides : SiO2, Al2O3, Fe2O3(T), MnO, MgO, Na2O, CaO, K2O, TiO2, P2O5 and 32 trace elements Ag, As, Ba, Br, Cd, Ce, Co, Cr, Cs, Cu, Ga, La, Mn, Nb, Nd, Ni, Mo, Pb, Rb, S, Sb, Sc, Sn, Sm, Sr, Th, Tl, U, V, Y, Zn, Zr are being done on routine basis.

 

Sample for SCXRD : Crystalline sample in solid form in the shape of  needle, block, spherical etc. is required.

 SCXRD Application : 3D intensity data collection for unit cell determination, structure solution, refinement and molecular graphics with packing diagram can be determined.

 XRD : The present working XRD is a fully Automated Computerized Powder X-ray Diffractometer, was installed in 2002 and has the following specifications.

Model :  X’Pert Pro

Make: Phillips

X-ray Tube : Cu

Angular Range(2θ) : 1o to 167o

Programmable Divergence Slit

Programmable fixed slits : 1/4o,1/2o,1o,2o & 4o

High Temp. Attachment of range upto 1600oC

Thin film Attachment

X’Pert Software & ICDD Database

XRF : The present working XRF is a Computerised Sequential X-ray Fluorescence Spectrometer, was installed in 2005 and has the  following specifications.

Model : Axios       

Make:PANalytical

X-ray Tube: Rh

Range: Oxygen to Uranium (Except rare earth)

AnalyzingCrystals : LiF200,Lif220,GE, PE,PX1

Detectors: Flow Proportional Counter & scintillation Counter.

SuperQ and Pro trace Software, Rock and Cement Standard Reference Materials

Analytical methods :Pressed Pellet and Fused Bead Method.

 


SCXRD: The present SCXRD is a fully Automated Single Crystal X-ray Diffractometer was installed in 2011 and has the following specifications. 

Model : Smart Apex II CCD Diffractometer

Make : Bruker

X-ray Tube: Mo

Kryoflex liquid N2 attachment

Color Video Camera for crystal mounting

Stereo zoom microscope with polariser




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